Stefan Hegnauer
2013-12-01 15:53:53 UTC
Hi there,
I bought an i1pro rev. D a few years ago (2nd hand, S/N 301759) and used it
for emissive measurements (display calibration, LED & lighting spectra
etc.). Works perfectly so far.
Now I would like to use it for reflection type measurements as well. The
reflection calibration tile that came with it has a different serial number
though (S/N 132782) and while it works somehow neither Argyll nor the OEM
tools reject it - I have reason to believe that the calibration data within
the i1pro is not exactly correct WRT the actual tile. E.g. there are dips
and peaks at certain wavelengths over a variety of different targets that
IMO can only be attributed to flaky calibration based on reflectivity data
that does not match the calibration tile I have. This is even more apparent
when using high resolution mode.
Assuming that I can measure the true tile reflection properties for 45°/0°
at a fine enough wavelength spacing and with sufficient accuracy how could
I use such data to correct the calibration of the i1pro for reflective
measurements? From the Argyll source code I reckon that the calibration
data is read at the beginning and then cached in a file for subsequent use
could this be utilized somehow? Thought I would ask before starting to
tamper with the sources especially as I am more a HW guy (EE).
Thanks and best regards
Stefan
I bought an i1pro rev. D a few years ago (2nd hand, S/N 301759) and used it
for emissive measurements (display calibration, LED & lighting spectra
etc.). Works perfectly so far.
Now I would like to use it for reflection type measurements as well. The
reflection calibration tile that came with it has a different serial number
though (S/N 132782) and while it works somehow neither Argyll nor the OEM
tools reject it - I have reason to believe that the calibration data within
the i1pro is not exactly correct WRT the actual tile. E.g. there are dips
and peaks at certain wavelengths over a variety of different targets that
IMO can only be attributed to flaky calibration based on reflectivity data
that does not match the calibration tile I have. This is even more apparent
when using high resolution mode.
Assuming that I can measure the true tile reflection properties for 45°/0°
at a fine enough wavelength spacing and with sufficient accuracy how could
I use such data to correct the calibration of the i1pro for reflective
measurements? From the Argyll source code I reckon that the calibration
data is read at the beginning and then cached in a file for subsequent use
could this be utilized somehow? Thought I would ask before starting to
tamper with the sources especially as I am more a HW guy (EE).
Thanks and best regards
Stefan